年度 2013
全部作者 Y. C. Lin, H. D. Trinh, T. W. Chuang, H. Iwai, K. Kakushima, P. Ahmet, C. H. Lin, C. H. Diaz, H. C. Chang, S. M. Jang, and E. Y. Chang
論文名稱 Electrical Characterization and Materials Stability Analysis of La2O3/HfO2 Composite Oxides on n-In0.53Ga0.47As MOS Capacitors with Different Annealing
期刊名稱 IEEE Electron Device Lett., vol. 34, no. 10, pp. 1229 – 1231, Oct. 2013
語言 中文